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Test ServicesGE Aviation has an extensive range of test equipment that can be made available to customers, including:
Digital testing up to 128 I/O at 100MHz Mixed signal testing up to 224 I/O at 100MHz Automatic wafer probing Life test and burn-in capabilities Temperature forcing units and environmental test equipment
The details are listed below:
Digital Tester
ATS-FT Testing up to 128 pins (I/O) at 100MHz Fairchild Sentry 20 – one single HV head, one double head (one HV, one HS)
Mixed Signal Tester
Eagle ETS600 – 224 pins – 100MHz Eagle LSI-5XP – 64 pins
Automatic Wafer Probe
TSK UF200
Life-test/Burn-in
Brumby Test System Ovens and support hardware
PIND tester
BW-LPD-4000
Temperature Forcing Units
Dragon III Temptronics 4010
Environmental Test
Thermal shock Temperature cycle (Techne 500) Vibration and Humidity (Environmental Design) Acceleration – Europa 24M Centrifuge Gross and fine leak
Analysis Tools
SEM + EDAX
To take advantage of any of these capabilities, please contact Ian Chandler on 44 (0) 1 684 297 777 or e-mail ian.chandler@ge.com
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Digital testing up to 128 I/O at 100MHz
Mixed signal testing up to 224 I/O at 100MHz
Automatic wafer probing
Life test and burn-in capabilities
Temperature forcing units and environmental test equipment
The details are listed below:
Digital Tester
ATS-FT Testing up to 128 pins (I/O) at 100MHz
Fairchild Sentry 20 – one single HV head, one double head (one HV, one HS)
Mixed Signal Tester
Eagle ETS600 – 224 pins – 100MHz
Eagle LSI-5XP – 64 pins
Automatic Wafer Probe
TSK UF200
Life-test/Burn-in
Brumby Test System Ovens and support hardware
PIND tester
BW-LPD-4000
Temperature Forcing Units
Dragon III
Temptronics 4010
Environmental Test
Thermal shock
Temperature cycle (Techne 500)
Vibration and Humidity (Environmental Design)
Acceleration – Europa 24M Centrifuge
Gross and fine leak
Analysis Tools
SEM + EDAX
To take advantage of any of these capabilities, please contact Ian Chandler on 44 (0) 1 684 297 777 or e-mail ian.chandler@ge.com